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Transmission Electron Microscopy

TEM is a valuable, frequently used, and important technique for the characterization of nanomaterials, used to obtain quantitative measures of particle and/or grain size, size distribution, and morphology [10,109,150]. The magnification of TEM is mainly determined by the ratio of the distance between the objective lens and the specimen and the distance between objective lens and its image plane [150]. TEM has two advantages over SEM: it can provide better spatial resolution and the capability for additional analytical measurements [10,148,150]. The disadvantages include a required high vacuum, thin sample section [10,109,148], and the vital aspect of TEM is that sample preparation is time consuming. Therefore, sample preparation is extremely important in order to obtain the highest-quality images possible.

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